Decreasing Test Time in High-Channel-Count Applications
April 26, 2019
Topics: Functional Test , Data Acquisition , LXI Platform , VXI Platform
When performing functional tests, keeping test times as short as possible is often a critical requirement. Time is money, after all. One way to reduce test times is to reduce the latency in setting up signal switch paths, stimulus devices, and measurements. These can all have a significant impact on the overall time it takes to complete a full functional test of a particular DUT.